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| Attribute | Details |
| BOOK TITLE | DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS |
| AUTHOR | Unknown |
| PUBLISHER | SPRINGER INDIA |
| ISBN13 | 9788184894295 |
| SUBJECT | |
| YEAR OF PUBLICATION | N/A |
| BINDING | N/A |
| PRICE | ₹ 599.00 |
| STOCK STATUS | IN STOCK |